IFM – Infinite Focus Microscopy

The IFM uses the optical technology of Focus Variation to measure an almost unlimited range of surfaces.

Components are traceably measured in high accuracy, with a high vertical resolution and in high repeatability.

The robust measurement principle of Focus-Variation in combination with a vibration-isolating hardware enables the form and roughness measurement of also large and heavy components.

All axes of InfiniteFocus are equipped with highly accurate encoders ensuring precise stage movement.


  • Surface and Microanalytics
  • 3-D imaging of surface structures and measurement of roughness using the focus variation method
  • measurement of profiles

Technical Specifications

Brucker Alicona - InfiniteFocus G4g System

  • non-contact, optical, three-dimensional, based on Focus-Variation incl. Vertical Focus Probing technology
  • Objective magnification: 2.5x to 100x
  • Vertical resolution:2300 to 10nm


Chemical and Physical Analytics

Chemical and Physical Analytics
Mittelstetter Weg 2, 86830 Schwabmünchen