Surface Analysis
The chemical and physical properties of a component surface do have significant impact on further processing steps like gluing, bonding, soldering, painting, etc. The habitus, i.e. shape, of the surfaces can often explain wanted or unwanted effects in further process steps. We have a broad portfolio of analytic means to characterize the surface structures from the millimeter down to the nanometer range.
Also knowledge of the chemical nature of a surface or the characterization of surface contaminations can help to understand failures or identify root causes in claim investigations.
The range of services of the laboratory covers the following test methods:
SEM - Scanning Electron Microscope
Scanning Electron Microscope (SEM) scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.
SEM - Scanning Electron MicroscopeEDX – Energy Dispersive X-ray-Analysis
Energy-dispersive X-ray spectroscopy (EDX) is an analytical technique that enables the chemical characterization/element al analysis of materials.
EDX – Energy Dispersive X-ray-AnalysisAFM – Atomic Force Microscopy
Atomic force microscopy (AFM) is a powerful technique that enables the imaging of almost any type of surface, including polymers, ceramics, composites or glass.
AFM – Atomic Force MicroscopyContact Profilometer
Profilometry is a technique used to extract topographical data from a surface. This can be a single point, a line scan or even a full three dimensional scan. The purpose of profilometry is to get surface morphology, step heights and surface roughness.
Contact ProfilometerIFM – Infinite Focus Microscopy
The Alicona G4 InfiniteFocus is a metrological tool that uses ‘Focus-Variation’ to measures form and roughness of surfaces. [...]
IFM – Infinite Focus MicroscopyContact Angle Measurement
The contact angle (wetting angle), is a quantitative measure of wetting of a solid by a liquid. Contact angle measurements of suitable liquids can be used to characterize material properties like the surface energy.
Contact Angle MeasurementEllipsometry
Ellipsometry is primarily used to determine film thickness and optical constants. However, it is also applied to characterize composition, crystallinity, roughness, doping concentration, and other material properties associated with a change in optical response
EllipsometryFTIR – Fourier Transform Infrared Spectroscopy
Fourier Transform Infrared Spectroscopy, also known as FTIR Analysis or FTIR Spectroscopy, is an analytical technique used to identify organic, polymeric, and, in some cases, inorganic materials. The FTIR analysis method uses infrared light to scan test samples and observe chemical properties.
FTIR – Fourier Transform Infrared SpectroscopyLABS-conformity
LABS-conformity describes the condition of a product or material that did not cause any paint wetting disturbance when tested.
LABS-conformity